科研人员

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朱敬军Jingjun Zhu

博士,副研究员,硕士生导师

Ph.D, Associate Professor, Master’s Supervisor

主要研究领域:

电子碰撞原子内壳层电离截面测量,暗物质探测,低本底探测

联系方式:

Tel: 028-85412732; E-Mail: zhujingjun@scu.edu.cn

       朱敬军,男,1977年11月生,博士,副研究员。2000年本科毕业于清华大学工程物理系,2005年研究生毕业于清华大学工程物理系,获核科学与工程专业博士学位。2005年毕业后在四川大学原子核科学技术研究所工作,主要从事电子碰撞原子内壳电离截面、RBS、PIXE、BIXS等的实验测量工作。2009年开始参加中国暗物质探测实验合作组(CDEX),负责中国锦屏地下实验室内暗物质探测实验的本底中子探测的研究工作。已主持或参加各类科研项目10余项,发表文章30多篇。



Associate Professor, Ph.D.

Institute of Nuclear Science & Technology, Sichuan University

Chengdu 610064

P.R.China

Tel: (86)028-85412732

Email: zhujingjun@scu.edu.cn

Education:

2000--2005, Tsinghua University, Ph.D

1996--2000, Tsinghua University, B.S

Interests

  • Inner shell ionization cross section detection

Atomic inner-shell ionization cross sections by electron or positron are very important not only for better understanding electron or positron-atom interactions but also for a lot of applications in radiation physics, astrophysics, plasma physics, and electron or positron-matter interaction modeling, as well as in quantitative analysis (electron probe microanalysis, Auger electron spectroscopy, and electron energy loss spectroscopy).

  • Nuclear analysis technique and applications

Nuclear analysis technique for example, RBS, PIXE, BIXS, and so on, is widely used in research of material science, component analysis and trace element analysis.

  • Dark matter research and Low background detection

In rare events experiment, for example, dark matter research and double beta decay, background suppression and detection is very important. Well understanding of the background is helpful for analysis of experiment data.



代表性论文和成果Selected Publications and Achievements

[1] J.L. Zhao, Z. An, J.J. Zhu, et al. Measurements of Lα, Lβ, Lγ and M X-ray production cross sections of Os, Ir and Pt by low-energy electron impact: Comparisons of experiment with theory, Radiation Physics and Chemistry, 134, 2017, 71-82

[2] J. J. Zhu, Y. Wu, Z. An. Electron-impact inner shell ionization crosssection measurements for heavy element impurities in fusion reactors, IAEA: Atomic and Plasma–material Interaction Data for fusion, 17, 2017, 85-98

[3] J.L. Zhao, Z. An, J.J. Zhu, et al. Investigations of L-shell X-ray production cross sections of In and Sn by low-energy electron impact, Journal of Physics B: Atomic Molecular and Optical Physics, 49(6), 2016, 065205

[4] C.X. Zhang, S.T. Lin, J.L. Zhao, et al. Discrimination of neutrons and γ-rays in liquid scintillator based on Elman neural network, Chinese Physics C, 40(8), 2016, 08620

[5] X.L Li, J.L Zhao, L.X Tian, et al. Measurements of inner-shell characteristic X-ray yields of thick W, Mo and Zr targets by low-energy electron impact and comparison with Monte Carlo simulations,Nucl. Instr. And Meth. B, 333, 2014, 106-112

[6] T. Fu, Z. An, J.J. Zhu, et al. Tritium and helium analyses in thin films by enhanced proton backscattering, Chinese Physics C, 38 (8), 2014, 088203

[7] J.J Zhu, Z An, M.T Liu, et al. Measurements of the K-shell ionization cross sections of Si by 3-25-keV electron impact using the thick-target method, Physical Review A, 79(5), 2009, 052710